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1

[SpringerBriefs in Applied Sciences and Technology] Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes ||

Yoshimura, Nagamitsu

Year:

2014

Language:

english

File:

PDF, 4.96 MB

english, 2014

2

Mechanism of contamination build-up induced by fine electron probe irradiation

Nagamitsu Yoshimura, Haruo Hirano, Terukazu Etoh

Journal:

Year:

1983

Language:

english

File:

PDF, 688 KB

english, 1983

3

Modeling of outgassing or pumping functions of the constituent elements such as chamber walls and high-vacuum pumps

Yoshimura, Nagamitsu

Journal:

Applied Surface Science

Year:

2001

Language:

english

File:

PDF, 122 KB

english, 2001

4

Vacuum Technology || Emitters for Fine Electron Probes

Yoshimura, Nagamitsu

Year:

2008

Language:

english

File:

PDF, 1.90 MB

english, 2008

5

Vacuum Technology || Designing of Evacuation Systems

Yoshimura, Nagamitsu

Year:

2008

Language:

english

File:

PDF, 1.24 MB

english, 2008

6

Vacuum Technology || Outgassing

Yoshimura, Nagamitsu

Year:

2008

Language:

english

File:

PDF, 2.94 MB

english, 2008

7

Vacuum Technology || Vacuum Pumps

Yoshimura, Nagamitsu

Year:

2008

Language:

english

File:

PDF, 1.30 MB

english, 2008

8

Vacuum Technology || Simulation of Pressures in High-Vacuum Systems

Yoshimura, Nagamitsu

Year:

2008

Language:

english

File:

PDF, 844 KB

english, 2008

9

Vacuum Technology || Microdischarges in High Vacuum

Yoshimura, Nagamitsu

Year:

2008

Language:

english

File:

PDF, 1.19 MB

english, 2008

10

Vacuum Technology || Phenomena Induced by Electron Irradiation

Yoshimura, Nagamitsu

Year:

2008

Language:

english

File:

PDF, 1.77 MB

english, 2008

11

A differential pressure-rise method for measuring the net outgassing rates of a solid material and for estimating its characteristic values as a gas source

Yoshimura, Nagamitsu

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1985

Language:

english

File:

PDF, 820 KB

english, 1985

12

Outgassing characteristics of an electropolished stainless-steel pipe with an operating extractor ionization gauge

Yoshimura, Nagamitsu

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1991

Language:

english

File:

PDF, 496 KB

english, 1991

13

Ar-pumping characteristics of diode-type sputter ion pumps with various shapes of ‘‘Ta/Ti’’ cathode pairs

Yoshimura, Nagamitsu

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1992

Language:

english

File:

PDF, 596 KB

english, 1992

14

Two-point pressure method for measuring the outgassing rate

Yoshimura, Nagamitsu

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1989

Language:

english

File:

PDF, 577 KB

english, 1989

15

A cascade diffusion pump system for an electron microscope

Yoshimura, Nagamitsu

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1984

Language:

english

File:

PDF, 738 KB

english, 1984

16

Water vapor permeation through Viton O ring seals

Yoshimura, Nagamitsu

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1989

Language:

english

File:

PDF, 487 KB

english, 1989

17

Outgassing characteristics and microstructure of a ‘‘vacuum fired’’ (1050 °C) stainless steel surface

Yoshimura, Nagamitsu

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1991

Language:

english

File:

PDF, 827 KB

english, 1991

18

Microdischarges on a high-voltage electron gun under high vacuum.

YOSHIMURA, Nagamitsu, WATANABE, Hisao, KATOH, Shoji, KOBAYASHI, Nobuyuki

Journal:

Year:

1987

File:

PDF, 2.09 MB

1987

19

Development of an ion pump for ultrahigh vacuum use.

HIRANO, Haruo, YOSHIMURA, Nagamitsu, OHARA, Kenji, ANDO, Ichiro

Journal:

Year:

1991

File:

PDF, 364 KB

1991

20

On the Vacuum System of Analytical Electron Microscope

YOSHIMURA, Nagamitsu, HIRANO, Haruo, ETOH, Terukazu

Journal:

Year:

1981

File:

PDF, 267 KB

1981

21

Ar-pumping Characteristics of Diode-type Sputter Ion Pumps with Various Shapes of "Ta/Ti" Cathode-pairs.

YOSHIMURA, Nagamitsu, OHARA, Kenji, ANDO, Ichiro, HIRANO, Haruo

Journal:

Year:

1992

Language:

english

File:

PDF, 682 KB

english, 1992

22

A New Vacuum System for an Electron Microscope

Yoshimura, Nagamitsu, Ohmori, Shigetomo, Nagahama, Yoriaki, Oikawa, Hisashi

Journal:

Japanese Journal of Applied Physics

Year:

1974

File:

PDF, 428 KB

1974

23

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Development of diffusion pump, baffle with a cold cap, and liq. N2 trap

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 2.57 MB

2020

24

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Ultrahigh-vacuum systems of electron microscopes

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 302 KB

2020

25

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Microstructure and elemental features of stainless-steel surface

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 2.86 MB

2020

26

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Ultrahigh-vacuum systems of electron microscopes

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 2.03 MB

2020

27

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Molecular-flow networks

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 5.13 MB

2020

28

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Characteristics of outgassing from metal surfaces

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 2.57 MB

2020

29

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Total and partial pressure gauges for ultrahigh-vacuum use

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 4.15 MB

2020

30

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Micro-discharges in high vacuum

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 5.90 MB

2020

31

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Electron-induced gas desorption

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 3.89 MB

2020

32

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Sputter-ion pumps for ultrahigh-vacuum use

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 5.23 MB

2020

33

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Phenomena induced by fine electron-probe irradiation

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 4.04 MB

2020

34

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Molecular-flow conductance and gas-flow patterns

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 2.72 MB

2020

35

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Outgassing rates of system-component materials

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 9.56 MB

2020

36

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Adsorption, desorption, diffusion, and outgassing/pumping

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 560 KB

2020

37

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Methods for measuring outgassing rates

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 3.44 MB

2020

38

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Cascade diffusion pump systems for electron microscopes

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 6.68 MB

2020

39

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes || Phenomena occurred in electron microscopes

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 27 KB

2020

40

Foundations of Molecular-Flow Networks for Vacuum System Analysis || Molecular-flow conductance

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 1.86 MB

2020

41

Foundations of Molecular-Flow Networks for Vacuum System Analysis || Physical basis of molecular-flow networks: adsorption, desorption, diffusion, and outgassing/pumping

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 1.88 MB

2020

42

Foundations of Molecular-Flow Networks for Vacuum System Analysis || Methods for measuring outgassing rates

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 1.07 MB

2020

43

Foundations of Molecular-Flow Networks for Vacuum System Analysis || Applications of the resistor-network simulation method to complicated ultrahigh vacuum systems

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 3.26 MB

2020

44

Foundations of Molecular-Flow Networks for Vacuum System Analysis || Total and partial pressure gauges for ultrahigh-vacuum use

Yoshimura, Nagamitsu

Year:

2020

File:

PDF, 1.70 MB

2020